CX-1000 Capacitance Film Thickness Profiler

CX-1000 Capacitance Film Thickness Profiler

Manufactured by Oakland Instruments

CX-1000 Capacitance Film Thickness Profiler is either a software driven or used as a standalone profiler. Easy to use high resolution profiles of plastic films.

Oakland pioneered this design back in 1986 and can be combined with the patented AutoCalTM self-calibration system ensuring high accuracy operation of this gauge.

Rugged yet high precision, at home either on the shop floor or in the laboratory. The CX-1000 can help solve even the toughest gauge issues.

The CX-1000 is best used with the CX-1200 CX-1200 Process Control Software this gives the user many ways to display the data such as:-

  • Polar Plots to show blown film die variation
  • Thickness vs length graph with tolerance bands
  • Statistical analysis, min, max, mean and standard deviation

CX-1000 Capacitance Film Thickness Profiler Theory of Operation

Thickness Testing is used in product development or quality control to measure the cross-web or down-web thickness profile of plastic film (less than 10 mil or 250 micron) and plastic sheet materials (up to 25 mil or 625 micron). The Oakland Instrument CX Series Film Thickness Gauges are off-line thickness testers, placed on a lab bench, used by an operator who cuts and prepares samples from the production line to run on the system.

The CX Series Gauges automatically feed or pull the sample strip through the tester for profiling. The procedure allows calculation and location of minimum thickness, maximum thickness, average thickness, and other statistics such as standard deviation of thickness data for a given sample.

CX Series Film Thickness Gauges utilize proprietary capacitance-sensors and precision contact measurement probes to determine the absolute thickness plus the thickness variation of the material measured when used in our patented AutoCalTM mode. Resolution to 0.001 mil (0.025 micron) and accuracy to 0.01 mil (0.25 micron) are achievable with the systems. Different non-contact sensor configurations, adjustable contact probe pressures, and contact probe tip & anvil styles are available to match the specific requirements of the materials you are trying to measure. Low foot pressures are utilised if there is a possibility of material compression during the self-calibration process.

Both self-calibrating CX Series models also come, standard, with flat anvil or with parallelism adjustment mechanisms to achieve parallelism of better than 20 microinches, to ensure measurement accuracy is maintained during the calibration process. Several Cycle Rates, Dwells, Drive Increments, and Measurement Units are available to meet your specific needs.


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